Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-05-09
2006-05-09
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C345S166000
Reexamination Certificate
active
07042575
ABSTRACT:
One embodiment relates to an optical displacement sensor for sensing transverse displacement of a data input device relative to a surface by determining displacement of optical features in a succession of frames. The sensor includes at least a coherent light source, illumination optics to illuminate a portion of the surface, imaging optics, and a first array of photosensitive elements having a periodic distance. The illuminator and the detector are configured to produce on the first array of photosensitive elements an intensity pattern of light reflected from the illuminated portion of the surface. The intensity pattern comprises a plurality of speckles having an average speckle diameter which is between one half and two times the periodic distance of the array.
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Carlisle Clinton B.
Lehoty David A.
Roxlo Charles B.
Trisnadi Jahja I.
Connolly Patrick J.
Okamoto & Benedicto LLP
Silicon Light Machines Corporation
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