Speckle pattern interferometer

Details Speckle pattern interferometer Speckle pattern interferometer

1975-03-03

1977-04-19

Corbin, John K.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

356113, G01B 902

Patent

active

040185311

ABSTRACT:
In a "speckle pattern" interferometer a coherent light beam is split into object and reference beams, the former being directed to illuminate a surface under inspection. Light scattered from this surface is imaged at an image location, at which there may be disposed the screen of a television camera device, the imaged light being reflected to the image location by a planar mirror. The reference beam is directed to the image location to interfere with the imaged light, this beam diverging to the image location from an effective point source located behind the mirror through an aperture in the mirror.

REFERENCES:
patent: 3673933 (1972-07-01), Hamann
patent: 3740150 (1973-06-01), Munnerlyn
patent: 3816649 (1974-06-01), Butters et al.

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