Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-08-15
2006-08-15
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07092104
ABSTRACT:
In a speckle interferometer apparatus2, an optical member mounting device10mounted with optical members including a pair of luminous flux outputting devices9a,9b,9c,9dis disposed on the object side of a main unit of an imaging device3while being separated from the imaging device3. A light-transmitting area14is formed between the pair of luminous flux outputting devices9a,9b,9c,9dso as to transmit therethrough interference light from an object surface.
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patent: 6417916 (2002-07-01), Dengler et al.
patent: 2001-311613 (2001-11-01), None
Hizuka Masatoshi
Kanda Hideo
Saito Takayuki
Fujinon Corporation
Lyons Michael A.
Pham Hoa Q.
Snider Ronald R.
Snider & Associates
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