Speckle interference method for remote thickness measurement of

Details Speckle interference method for remote thickness measurement of Speckle interference method for remote thickness measurement of

1995-06-26

1997-07-22

Gonzalez, Frank

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, 356357, G01B 902

Patent

active

056508514

ABSTRACT:
A method and an apparatus are disclosed for remotely determining the thickness of a transparent or semi-transparent suspended sheet or solid or liquid layer, e.g. ice, on a solid surface which is either light-absorbent or highly reflective. The invention proposes directing a coherent beam of light onto a location on the layer such that the beam undergoes partial reflection from the top of the layer and partial reflection from the bottom of the layer or the underlying surface. Due to the coherency of the beam, two overlapping speckle patterns are produced which give rise to an interference pattern having interference fringes. The pattern can be caused to shift across the field of view and the shift, determined by a number of the passing interference fringes can be interpreted in terms of the thickness of the layer.

REFERENCES:
patent: 4660980 (1987-04-01), Takabayashi et al.
patent: 5276501 (1994-01-01), McClintock et al.

Affiliated with

Also associated with

Rating

Speckle interference method for remote thickness measurement of does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Speckle interference method for remote thickness measurement of , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Speckle interference method for remote thickness measurement of will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1563123