Image analysis – Applications
Reexamination Certificate
2005-05-24
2005-05-24
Couso, Yon J. (Department: 2625)
Image analysis
Applications
C382S128000, C250S201300, C356S039000
Reexamination Certificate
active
06898296
ABSTRACT:
A specimen processing system according to the present invention includes a plurality of specimen processing units each having flat sides and a specimen operating surface and operated singly. The specimen processing units have at least the same depth dimension, and the specimen operating surfaces of the specimen processing units have the same height dimension. The system further includes a coupling section for closely coupling the right and left sides of the specimen processing units to each other and a single driving control unit for controlling a related operation of all of the specimen processing units coupled to each other by the coupling section and a single operation of a designated one of the specimen processing units.
REFERENCES:
patent: 4363781 (1982-12-01), Akamatsu et al.
patent: 5366896 (1994-11-01), Margrey et al.
patent: 5428690 (1995-06-01), Bacus et al.
patent: 5499097 (1996-03-01), Ortyn et al.
patent: 5548661 (1996-08-01), Price et al.
patent: 5587833 (1996-12-01), Kamentsky
patent: 5699794 (1997-12-01), Fleck
patent: 6355487 (2002-03-01), Kowallis
patent: 3-285175 (1991-12-01), None
patent: 10-49201 (1998-02-01), None
Couso Yon J.
Nixon & Vanderhye
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