Specimen preview and inspection system

Image analysis – Applications – Biomedical applications

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348 79, 377 10, 702 21, G06K 900

Patent

active

061480967

ABSTRACT:
A specimen preview and inspection system is disclosed. The system beneficially includes a preview stage, which provides a set of biasing-information for preview by a technician before the technician formally screens the specimen. The preview stage enables the technician to conveniently review information pertinent to the specimen at issue. The preview stage may thereby bias, or channel, the technician's attention during screening toward diagnostically significant aspects of the specimen. The invention is particularly useful in the context of Pap smear screening, although the invention may extend to inspection of other types of specimens or samples as well.

REFERENCES:
patent: 3600556 (1971-08-01), Acker
patent: 3851972 (1974-12-01), Smith et al.
patent: 4175860 (1979-11-01), Bacus
patent: 4404683 (1983-09-01), Kobayashi et al.
patent: 4513438 (1985-04-01), Graham et al.
patent: 4812909 (1989-03-01), Yokobayashi et al.
patent: 4965725 (1990-10-01), Rutenberg et al.
patent: 5068906 (1991-11-01), Kosaka
patent: 5134662 (1992-07-01), Bacus et al.
patent: 5231674 (1993-07-01), Cleveland et al.
patent: 5257182 (1993-10-01), Luck et al.
patent: 5287272 (1994-02-01), Rutenberg et al.
patent: 5333207 (1994-07-01), Rutenberg
patent: 5526258 (1996-06-01), Bacus
patent: 5528703 (1996-06-01), Le
patent: 5544650 (1996-08-01), Boon et al.
patent: 5548661 (1996-08-01), Price et al.
patent: 5625705 (1997-04-01), Recht
patent: 5627908 (1997-05-01), Lee et al.
patent: 5655029 (1997-08-01), Rutenberg et al.
patent: 5671288 (1997-09-01), Wilhelm et al.
patent: 5677966 (1997-10-01), Doerrer et al.
patent: 5710842 (1998-01-01), Lee
patent: 5715326 (1998-02-01), Ortyn et al.
patent: 5715327 (1998-02-01), Wilhelm et al.
patent: 5740269 (1998-04-01), Oh et al.
patent: 5741648 (1998-04-01), Hemstreet, III et al.
patent: 5745601 (1998-04-01), Lee et al.
patent: 5757954 (1998-05-01), Kuan et al.
patent: 5867308 (1999-02-01), Pensel et al.
patent: 5889880 (1999-03-01), Doerrer et al.
International Search Report in PCT/US98/14714, dated Oct. 27, 1998.
International Search Report in PCT/US98/14719, dated Oct. 27, 1998.
Search Report in United Kingdom Patent Application No. GB 9722555.1, dated Jan. 14, 1998.
Neuromedical Systems, Inc. web page http://www.papnet.com dated May 28, 1997.
AcCell.TM. -Savant A cellular DNA analysis system, AccuMed International, Inc. 1997 (brochure).

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