Specimen observation apparatus including an optical microscope a

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means

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350 87, 250310, G02B 2100

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043492428

ABSTRACT:
A specimen observation apparatus for obtaining both an optical microscope image and a scanning electron microscope image simultaneously from one specimen. The apparatus includes a transparent glass plate having a transparent electrically conductive layer on a surface thereof for supporting the specimen in a vacuum column. The glass plate seals off one end of the vacuum column. The specimen position is illuminated with light and an electron beam along the same optical axis in the vacuum column to create both an optical microscope image with the light passing through the specimen and a scanning electron microscope image based on information obtained by scanning the electron beam over the specimen. The glass plate, while sealing one end of the vacuum column, is movably disposed about the optical axis. An optical microscope is located outside the vacuum column near to the glass plate.

REFERENCES:
patent: 3150255 (1964-09-01), Wilska
patent: 3169183 (1965-02-01), Radtke et al.
patent: 3371185 (1968-02-01), Anderson
patent: 3378670 (1968-04-01), Smith et al.
patent: 3761709 (1973-09-01), Hasegawa et al.

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