Specimen holder having an insert for atomic force microscopy

Details Specimen holder having an insert for atomic force microscopy Specimen holder having an insert for atomic force microscopy

2003-12-10

2010-06-01

Warden, Jill (Department: 1797)

Chemical apparatus and process disinfecting, deodorizing, preser

Control element responsive to a sensed operating condition

C422S091000, C083S915500, C435S040520, C436S174000, C436S176000

Reexamination Certificate

active

07727481

ABSTRACT:
A specimen holder (10) is proposed in order to create a capability for preparing, in a cutting device, in particular a microtome or ultramicrotome, a specimen that is to examined in an AFM. The specimen holder (10) is embodied in several parts. It comprises an insert (12) in which the specimen is secured. Also provided is a receiving ring (14) in which the insert (12) can be received. The insert together with the receiving ring (14) is mounted, in particular thread-joined, on a base element (16). As a result of the mounting of the receiving ring (14) on the base element (16), the insert together with the specimen is fixed in its position.

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Y. Thomann, R. Thomann, G. Bar, M. Ganter, B. Machutta & R. Muelhaupt, “Combined ultramicrotomy for AFM and TEM using a novel sample holder”, Journal of Microscopy, vol. 195, Pt. 2, Aug. 1999, pp. 161-163.
Journal of Microscopy, “Combined ultramicrotomy for AFM and TEM using a novel sample holder”, vol. 195, Pt. 2, Aug. 1999, pp. 161-163.

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