Image analysis – Applications – Manufacturing or product inspection
Patent
1997-08-20
1999-08-03
Mancuso, Joseph
Image analysis
Applications
Manufacturing or product inspection
G06K 900
Patent
active
059335220
ABSTRACT:
An object of the present invention is to provide a device for and a method of searching a really defective cell by removing influence of poor accuracy of a stage shifting mechanism or a numerical operation error of the device. The method of the present invention is a method of searching a specific cell of memory LSI, said method being employed in performing analysis, processing and observation operation with reference to a part of a physical address which corresponds to a logical address outputted as a result of an electrical test performed on memory LSI of array structure in which a plurality of memory cells are repeatedly arranged. Further, position coordinates are continuously observed with reference to an area including the end point of the array structure of said memory cell, the memory cells and a part between the memory cells; the number of memory cells on memory cell LSI is counted according to changes in brightness or luminosity; and a part in which said counted value and the value shown by said physical address coincide with each other is selected as the part of said logical address.
REFERENCES:
patent: 5506555 (1996-04-01), Hoshino
Bali Vikkram
Mancuso Joseph
NEC Corporation
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