Optics: measuring and testing – Material strain analysis
Patent
1984-08-13
1987-03-31
McGraw, Vincent P.
Optics: measuring and testing
Material strain analysis
250227, G01B 1116
Patent
active
046539069
ABSTRACT:
An optical strain measuring arrangement including an optical waveguide comprising first and second cores fixedly mounted with respect to a mechanical structure to be monitored, and a detection system for relating the contrast in light intensity emerging from said cores to a range of wavelengths to establish an indication of strain along the range of the optical waveguide.
REFERENCES:
patent: 4295738 (1981-10-01), Meltz et al.
patent: 4298794 (1981-11-01), Snitzer et al.
S. K. Yao et al., Applied Optics, vol. 21, pp. 3059-3060, (1982).
Dunphy James R.
Meltz Gerald
Snitzer Elias
McGraw Vincent P.
Ruzek Peter R.
Sabath Robert P.
United Technologies Corporation
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