Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1990-07-24
1993-11-02
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351208, A61B 310, A61B 314
Patent
active
052587916
ABSTRACT:
A spatially resolved map of the eye's refractive characteristics are provided by measuring the eye's refractive characteristics on a point-by-point basis across the anterior surface of the eye. This spatially resolved refraction data may be obtained subjectively by providing a reference pattern and a measurement beam, by establishing a particular position on the cornea as the location to be measured and manipulating the orientation of the measurement beam at that measurement point to bring the measurement beam to a desired position relative to the reference image. When the patient indicates that the measurement beam is in the desired position relative to the reference pattern, the orientation of the beam is recorded as the refractive data for that measurement point and the process proceeds to another measurement point. This provides relatively rapid, physiologically accurate refractive data on a spatially resolved basis. Alternatively, this spatially resolved refraction data may be obtained objectively by independently controlling the position and orientation of a measurement beam and using a feedback null system to determine the refractive characteristics. This enables rapid, automatic non-subjective determination of the refractive characteristics of the eye and thereby provides the ability to provide improved correction of the eye. This spatially resolved refraction information enables spatially resolved correction of vision by spatially resolved shaping of the anterior surface of the eye.
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Penney Carl M.
Thompson Keith P.
Tiemann Jerome J.
Webb Robert H.
Bovernick Rodney B.
General Electric Company
McDaniel James R.
Webb II Paul R.
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