Spatially resolved electromagnetic property measurement

Electricity: measuring and testing – Magnetic – Magnetometers

Reexamination Certificate

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C073S105000, C324S719000

Reexamination Certificate

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07078896

ABSTRACT:
A method for determining a magnetic force profile of a sample by using a cantilevered probe having a magnetic tip, the method comprising the steps of: traversing the tip along a predetermined path on the surface of the sample, the tip being proximate the surface of the sample while traversing along the predetermined path; determining the sample surface topography along the path; substantially canceling the sample surface potential along the path using the determined sample surface topography; and determining magnetic force data along the path based on the determined surface topography, wherein the determined magnetic force data is not magnetic force gradient data and the determined magnetic force data includes substantially no components from the sample surface potential.

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