Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-03-29
2005-03-29
Le, N. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S762010
Reexamination Certificate
active
06873163
ABSTRACT:
A scanning probe detects phase changes of a cantilevered tip proximate to a sample, the oscillations of the cantilevered tip are induced by a lateral bias applied to the sample to quantify the local impedance of the interface normal to the surface of the sample. An ac voltage having a frequency is applied to the sample. The sample is placed at a fixed distance from the cantilevered tip and a phase angle of the cantilevered tip is measured. The position of the cantilevered tip is changed relative to the sample and another phase angle is measured. A phase shift of the deflection of the cantilevered tip is determined based on the phase angles. The impedance of the grain boundary, specifically interface capacitance and resistance, is calculated based on the phase shift and the frequency of the ac voltage. Magnetic properties are measured by applying a dc bias to the tip that cancels electrostatic forces, thereby providing direct measurement of magnetic forces.
REFERENCES:
patent: 5266801 (1993-11-01), Elings et al.
patent: 5308974 (1994-05-01), Elings et al.
patent: 5465046 (1995-11-01), Campbell et al.
patent: 5847569 (1998-12-01), Ho et al.
patent: 6201401 (2001-03-01), Hellemans et al.
patent: 6530266 (2003-03-01), Adderton et al.
patent: 20020021139 (2002-02-01), Jackson
Semancik, S. et al., “Kinetically controlled chemical sensing using micromachined structures”,Acc. Chem. Res., 1998, 31, 279-287.
Hagfeldt, M. et al., “Molecular Photovolataics”,Acc. Chem Res., 2000, 33, 269-277.
Hong, B.S. et al., “Equilibrium electrical property measurements in electroceramics”,Key Engineering Materials, 1997, (125-126),163-186.
Jiang, S.P. et al., “Electrochemical techniques in studies of solid ionic conductors”,Key Engineering Materials, 1997, (125-126), 81-132.
Hari, N.S. et al., “Complex impedance analyses of n-BaTiO3 ceramics showing positive temperature coefficient of resistance”,Journal of Materials Science in Electronics, 1997, 8, 15-22.
Waser, R. et al., “Grain boundaries in dielectric and mixed-conducting ceramics”,Acta Mat, 2000, 48, 797-825.
Fleig, J. et al., “Microcontact impedance measurements of individual highly resistive grain boundaries: General aspects and application to acceptor-doped SrTiO3”,Journal of Applied Physics, 2000, 87(5), 2372-2381.
Kim, S.H. et al., “Influence of defect segregation on the electrical properties on Nb-doped SrTiO3 grain boundary layer”,Jpn. J. Appl. Phys., 2000, 39, 1788-1795.
Skapin, A.S. et al., “Grain boundary conductance in AgCl gained by micro-contact impedance spectroscopy”,Solid State Ionics, 2000, 133, 129-138.
Hwang, J.H. et al., “ingle grain boundary characterization of Nb-doped SrTiO3 bicrystals using ac four-point impedance spectroscopy”,Applied Physics Letters., 2000, 76, 2621-2623.
Tanaka, S. et al., “Direct measurements of voltage-current characteristics of single grain boundary of ZnO viristors”,Journal of the European Ceramic Society., 1999, 19, 727-730.
Kalinin, S.V. et al., “Surface potential at surface-interface junctions in SrTiO3 bicrystals”,Physical ReviewB,62(15), 10 419-10 430 , 2000.
Huey, B.D. et al., “Spatially localized dynamic properties of individual interfaces in semiconducting oxides”,Applied Physics Letters, 2000, 76(8), 1012-1014.
Williams, C.C. “Two-dimensional dopant profiling by scanning capacitance microscopy”,Annu. Rev. Mat Sci., 1999, 29, 471-504.
De Wolf, P. et al., “One- and two-dimensional carrier profiling in semiconductors by nanospreading resistance profiling”, J,Vac. Sci. Technol, 1996, 14(1), 380-385.
Oyama, Y, et al., “Analysis of scanning probe used for simultaneous measurement of tunneling current and surface potential”,Journal of Applied Physics., 1999, 86(12), 7087-7093.
Stranick, S.J. et al., “A versatile microwave-frequency-compatible scanning tunneling microscope”,Rev. Sci. Instrum., 1993, 64(5), 1232-1234.
Cho, Y. et al., “Scanning nonlinear dielectric microscope”,Rev. Sci. Instr., 1996, 67(6), 2297-2303.
Chaikin, P.M. et al.,Principles of Condensed Matter Physics, 1997, Cambridge University Press, New York.
Sarid, D.,Scanning Force Microscopy, 1991, Oxford University Press, New York.
Kim, S.H. et al., “Effect of MnO addition on the electrical properties of Nb-doped SrTiO3 varistor”,Materials in Science&Engineering., 1999, 56, 12-20.
Pike, G.E. “Semiconductor grain boundary admittance: Theory”,Phys. Rev, 1984, 30, 795-802.
Blatter, G, “Electrical breakdown at semiconductor grain boundaries”,Phys. Rev. B., 1986, 34(12), 8555-8572.
Babcock, K. et al., “Magnetic force microscopy: Recent advances and applications”,Matter. Res. Soc. Syrup. Proc, 1995, 355, 311-323.
Zhong, Q. et al., “Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy”,Surface Science Letters., 1993, 290, L688-L692.
Rice, P., et al., “Observation of the effects of tip magnetization states on megnetic force microscopy images”,J. Appl. Phys., 1999, 85(8), 5163-5165.
Ferrier, R.P. et al., “Characterisation of MFM tip fileds by electron tomography”,IEEE Transactions on Magnetics., 1997, 33(5), 4062-4064.
Hug, H.J. et al., “Quantitative magnetic force microscopy on perpendicularly magnetized samples”,J. Appl. Phys., 1998, 83(11), 5609-5620.
Ishii, I. et al., “A novel numerical approach to interpret images obtained by magnetic force microscope”,IEEE Transactions on Magnetics, 1998, 34(5), 3455-3458.
Saito, H. et al., “Description of magnetic force microscopy by three-dimensional tip Green's function for sample magnetic charges”,Journal of Magnetism&Magnetic Materials, 1999, 191, 153-161.
Tomilson, S.L. et al., “Micromagnetic model for magnetic force microscopy tips”,J. Appl. Phys., 1997, 81(8), 5029-5031.
Al-Khafaji, M.A., “Magnetic force microscopy of nanocrystalline NdFeB ribbons: A study of tip-sample interaction using a well-characterised sample”,Journal of Magnetism&Magnetic Materials, 1998, 182, 111-123.
Hartmann, U., “The point dipole approximation in magnetic force microscopy”,Physics Letters A., 1989, 137(9), 475-478.
Hartmann, U., “Magnetic force microscopy”,Annu. Rev. Mater Sci, 1999, 29, 53-87.
Kong, L. et al., “Quantification of magnetice force microscopy using a micronscale current ring”,Appl. Phys. Lett, 1997, 70(15), 2043-2045.
Hartmann, U., “Theory of magnetic force microscopy”,J. Vac. Sci. Technol, 1990, 8(1),411-415.
Lohau, J. et al., “Quantitative determination of effective dipole and monopole moments of magnetic force microscopy tips”, J. Appl. Phys., 1999, 86(6), 3410-3417.
Weaver, J.M.R. et al., “High resolution atomic force microscopy potentiometry”,J. Vac. Sci. Technol., 1991, 9, 1559-1561.
Nonnenmacher, M. et al., “Kelvin probe force microscopy”,Appl. Phys. Lett, 1991, 58(25), 2921-2923.
Alvarez Rodolfo Antonio
Bonnell Dawn A.
Kalinin Sergei V.
Benson Walter
Le N.
The Trustees of the University of Pennsylvania
Woodcock & Washburn LLP
LandOfFree
Spatially resolved electromagnetic property measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Spatially resolved electromagnetic property measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Spatially resolved electromagnetic property measurement will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3439543