Spatially isolated diffractor on a calibration substrate for a p

Optics: measuring and testing – Standard

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01J 102, G01N 2188

Patent

active

054538300

ABSTRACT:
A test device for calibrating an optical surface inspection system, such as a pellicle or reticle inspection system, comprising a substrate having raised diffractors with at least one beam-diffracting geometric feature aligned to diffract light directed from an angle of incidence of less than 30.degree. . The beam-diffracting geometric feature is preferably a vertex aligned generally perpendicular to the surface of the substrate. A detection beam which impinges the vertex is diffracted, with diffracted beams being collected by a collector. The raised diffractor thereby simulates a foreign particle on a substrate, allowing calibration of the system. The apparent size of the diffractor and therefore the simulated particle can be varied by varying the vertices or the height of the raised diffractor. If a substrate is to have more than one diffractor, the diffractor should be spaced apart by a distance greater than the diameter of the detection beam.

REFERENCES:
patent: 4386850 (1983-06-01), Leahy
patent: 4468120 (1984-08-01), Tanimoto et al.
patent: 4512659 (1985-04-01), Galbraith et al.
patent: 4610541 (1986-09-01), Tanimoto et al.
patent: 4636073 (1987-01-01), Williams
patent: 4767660 (1988-08-01), Hosoda et al.
patent: 4889998 (1989-12-01), Hayano et al.
patent: 4966457 (1990-10-01), Hayano et al.
Gaston, C. A., "Standard Wafer for Intensity and Focus Testing," IBM Technical Disclosure Bulletin, vol. 24, No. 11A, Apr. 1982.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Spatially isolated diffractor on a calibration substrate for a p does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Spatially isolated diffractor on a calibration substrate for a p, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Spatially isolated diffractor on a calibration substrate for a p will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1554904

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.