Spatially-heterodyned holography

Details Spatially-heterodyned holography Spatially-heterodyned holography

2006-02-21

2006-02-21

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

Having light beams of different frequencies

C356S457000

Reexamination Certificate

active

07002691

ABSTRACT:
A method of recording a spatially low-frequency heterodyne hologram, including spatially heterodyne fringes for Fourier analysis, includes: splitting a laser beam into a reference beam and an object beam; interacting the object beam with an object; focusing the reference beam and the object beam at a focal plane of a digital recorder to form a spatially low-frequency heterodyne hologram including spatially heterodyne fringes for Fourier analysis; digital recording the spatially low-frequency heterodyne hologram; Fourier transforming axes of the recorded spatially low-frequency heterodyne hologram including spatially heterodyne fringes in Fourier space to sit on top of a heterodyne carrier frequency defined by an angle between the reference beam and the object beam; cutting off signals around an origin; and performing an inverse Fourier transform.

REFERENCES:
patent: 4094011 (1978-06-01), Nagao
patent: 4832494 (1989-05-01), Tyrer
patent: 5299035 (1994-03-01), Leith et al.
patent: 5339152 (1994-08-01), Horn
patent: 5410397 (1995-04-01), Toeppen
patent: 5467184 (1995-11-01), Tenjimbayashi
patent: 5515183 (1996-05-01), Hashimoto
patent: 5877873 (1999-03-01), Bashaw et al.
patent: 5995251 (1999-11-01), Hesselink et al.
patent: 6078392 (2000-06-01), Thomas et al.
patent: 6262818 (2001-07-01), Cuche et al.
patent: 6525821 (2003-02-01), Thomas et al.
patent: 6597446 (2003-07-01), Marks et al.
patent: 6747771 (2004-06-01), Thomas et al.
patent: 2002/0159052 (2002-10-01), Klooster et al.
patent: 2003/0016364 (2003-01-01), Thomas et al.
patent: 2003/0227658 (2003-12-01), Thomas et al.
patent: 2004/0021871 (2004-02-01), Psaltis et al.
patent: 2004/0042015 (2004-03-01), Price
patent: 2004/0042056 (2004-03-01), Price et al.
patent: 2004/0042057 (2004-03-01), Thomas et al.
patent: 2004/0057089 (2004-03-01), Voelkl
patent: 2004/0130762 (2004-07-01), Thomas et al.
patent: 2004/0212807 (2004-10-01), Hanson et al.
patent: 2004/0213462 (2004-10-01), Hanson et al.
patent: 2004/0213464 (2004-10-01), Hanson et al.
patent: 04040622 (1992-01-01), None
patent: WO 98/57234 (1998-12-01), None
Invention of Holography: D. Gabor, Proc. Roy. Soc. London Ser. A A197, 459 (1949).
Invention of Sideband (Hetrodyne) Holography: E. Leith and J. Upatnieks, J. Opt. Soc. Am. 52, 1123 (1962) and J. Opt. Soc. Am. 53 1377 (1963).
Mathematical Treatise on Holography: J.B. Develis and G.O. Reynolds,Theory and Application of Holography, Addison-Wesley, Reading, MA, 1967.
Holographic Interferometry: L.O. Heflinger, R.F. Wuerker, and R.E. Brooks, J. Appl. Phys. 37, 642 (1966).
Discussion of Focused Holography (used for holographic interferometry): F.E. Jahoda, R.A. Jeffries and G.A. Sawyer, Appln. Opt. 6, 1407 (1967).
Interferogram Analysis: Digital Fringe Pattern Measurement Techniques, M. Kujawinska, (edited by D.W. Robinson and G.T. Reid), IOP Publishing Ltd., Bristol, England, 1993).
Holographic Interferometry: Principles and Methods, K. Creath and T. Kreis (edited by K. Rastogi), Springer-Verlag, New York, New York, 1994.
Papers by E. Voelkl on Fourier transform analysis of electron holography: E. Voelkl, L.F. Allard, and B. Frost, J. Microscopy 180, pt. 1, Oct., 1995, pp. 39-50.
E. Voelkl, L.F. Allard, A. Datye, B. Frost, Ultramicroscopy 58, (1995), pp. 97-103.
E. Voelkl, L.F. Allard, ICEM-13 (13th International Conference on Electron Microscopy), Jul., 17-22, 1994, Paris, France, Proceedings, p. 287.
Volkl, E., et al. “Advanced Electron Holography: A New Algorithm for Image Processing and Standardized Quality Test for the FEG Electron Microscope”, ULTRAMICROSCOPY 58 (1995) 97-103.
Volkl, E., et al., “A Software Package for the Processing and Reconstruction of Electron Holograms”, Journal of Microscopy, vol. 180, pt. 1, Oct., 1995, pp. 39-50.
Leith, E.N. “Reconstructed Wavefronts and Communication Theory”, Journal of Optical Society of America, vol. 52 No. 10, Oct. 1962.
Gabor, D., et al., “Microscopy by Reconstructed Wave-Fronts”, Research Laboratory, Aug. 1948, pp. 454-487.
Leith, E.N., et al., “Wavefront Reconstruction with Continuous-Tone Objects”, Journal of the Optical Society of America, vol. 53, No. 12, Dec. 1963.
Leith, E.N., et al., “Wavefront Reconstruction with Diffused Illumination and Three Dimensional Objects”, Journal of the Optical Society of America, vol. 54, No. 11, Nov. 1964.
North, J.C., et al., “Holographic Interferometry”, Journal of Applied Physics, vol. 37, No. 2, Feb. 1966.
Kujawinska, M., “Digital Fringe Pattern Measurement Techniques”, Interferogram Analysis.
DeVelis, J.B., et al., “Theory and Applications of Holography”, (1967).
Jahoda, F.C., et al., “Fractional-Fringe Holographic Plasma Interferometry”, Applied Optics, Aug. 1967, vol. 6, No. 8, pp. 1407-1410.
Jahoda, F.C., et al., “Holographic Interferometry Cookbook”, Los Alamos Scientific Laboratory, Oct. 1972.
Rastogi, P.K., “Holographic Interferometry”, Optical Science Center, University of Arizona, vol. 68 (1994).
Volkl, E., et al., “The Extended Fourier Algorithm. Application in Discrete Optics and Electron Holography”, High Temperature Materials Laboratory, Jul. 1994.
Volkl, E., et al. “Advanced Electron Holography: A New Algorithm for Image Processing and Standardized Quality Test for the FEG Electron Microscope”, Ultramicroscopy 58 (1995) 97-103.
Volkl, E., et al., “A Software Package for the Processing and Reconstruction of Electron Holograms”, Journal of Microscopy, vol. 180, pt. 1, Oct., 1995, pp. 39-50.
Leith, E.N. “Reconstructed Wavefronts and Communication Theory”, Journal of Optical Society of America, vol. 52 No. 10, Oct. 1962.
Gabor, D., et al., “Microscopy by Reconstructed Wave-Fronts”, Research Laboratory, Aug. 1948, pp. 454-487.
Leith, E.N., et al., “Wavefront Reconstruction with Continuous-Tone Objects”, Journal of the Optical Society of America, vol. 53, No. 12, Dec. 1963.
Invention of Holography: D. Gabor, Proc. Roy. Soc. London Ser. A A197, 459 (1949).
Invention of Sideband (Hetrodyne) Holography: E. Leith and J. Upatnieks, J. Opt. Soc. Am. 52, 1123 (1962) and J. Opt. Soc. Am. 53 1377 (1963).
Mathematical Treatise on Holography: J.B. Develis and G.O. Reynolds,Theory and Application of Holography, Addison-Wesley, Reading, MA, 1967.
Invention of Holographic Interferometry: L.O. Heflinger, R.F. Wuerker, and R.E. Brooks, J. Appl. Phys. 37, 642 (1966).
Discussion of Focused Holography (used for holographic interferometry): F.E. Jahoda, R.A. Jeffries and G.A. Sawyer, Appln. Opt. 6, 1407 (1967).
Interferogram Analysis: Digital Fringe Pattern Measurement Techniques, M. Kujawinska, (edited by D.W. Robinson and G.T. Reid), IOP Publishing Ltd., Bristol, England, 1993).
Holographic Interferometry: Principles and Methods, K. Creath and T. Kreis (edited by K. Rastogi), Springer-Verlag, New York, New York, 1994.
Papers by E. Voelkl on Fourier transform analysis of electron holography: E. Voelkl, L.F. Allard, and B. Frost, J. Microscopy 180, pt. 1, Oct., 1995, pp. 39-50.
E. Voelkl, L.F. Allard, A. Datye, B. Frost, Ultramicroscopy 58, (1995), pp. 97-103.
E. Voelkl, L.F. Allard, ICEM-13 (13th International Conference on Electron Microscopy), Jul., 17-22, 1994, Paris, France, Proceedings, p. 287.
Leith, E.N., et al., “Wavefront Reconstruction with Diffused Illumination and Three Dimensional Objects”, Journal of the Optical Society of America, vol. 54, No. 11, Nov. 1964.
North, J.C., et al., “Holographic Interferometry”, Journal of Applied Physics, vol. 37, No. 2, Feb. 1966.
Kujawinska, M., “Digital Fringe Pattern Measurement Techniques”, Interferogram Analysis.
DeVelis, J.B., et al., “Theory and Applications of Holography”, (1967).
Jahoda, F.C., et al., “Fractional-Fringe Holographic Plasma Interferometry”, Applied Optics, Aug. 1967, vol. 6, No. 8, pp. 1407-1410.
Jahoda, F.C., et al., “Holographic Interferomet

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