Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-07-19
2008-08-19
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S627000, C324S705000, C073S30400R
Reexamination Certificate
active
07414414
ABSTRACT:
A guarded sense impedance for use in a measurement instrument includes a sense impedance adapted to have a spatially distributed electrical potential and at least one guard structure adapted to have the spatially distributed electrical potential. The guard structure is arranged to provide a spatially distributed guard potential for the sense impedance.
REFERENCES:
patent: 4332167 (1982-06-01), Sun et al.
patent: 5153502 (1992-10-01), Morgan et al.
patent: 6278281 (2001-08-01), Bauer et al.
patent: 2002/0171433 (2002-11-01), Watanabe et al.
patent: 2003/0136189 (2003-07-01), Lauman et al.
Cawley Kevin
Gibbons John
Goeke Wayne C.
Niemann James A.
Keithley Instruments Inc.
Nguyen Vincent Q
Pearne & Gordon LLP
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