Spatial wavefront evaluation by intensity relationship

Details Spatial wavefront evaluation by intensity relationship Spatial wavefront evaluation by intensity relationship

1992-02-07

1994-11-22

Buczinski, Stephen C.

Optics: measuring and testing

By particle light scattering

With photocell detection

2502019, 356121, 356353, G01B 902, G01J 100

Patent

active

053673751

ABSTRACT:
A method, and apparatus for accomplishing the method, for determining a phase difference of a wavefront at a first (pupil) plane (P1), the wavefront propagating from the first plane to a second (image) plane (P2). The method includes the steps of providing an intensity of the wavefront at the first plane; measuring an intensity of the wavefront at the second plane; and determining the phase difference of the wavefront at the first plane in accordance with a transfer function that employs the provided intensity of the wavefront at the first plane and the measured intensity of the wavefront at the second plane. A single expression describing an Optical Transfer Function is developed and is shown to involve only the unknown aperture phase and known quantities. A solution to this expression, achieved by a polynomial expansion technique or by a sampling technique, is shown to yield the phase at the aperture and, together with the intensity at the aperture, to define the aperture wavefront.

REFERENCES:
patent: 4309602 (1982-01-01), Gonsalves et al.
patent: 4690555 (1987-09-01), Ellerbroek
N. Nakajima, J. Optical Soc. Amer., vol. A4, No. 1, Jan. 1987, p. 154.
M. Perez-Ilzarbe et al., J. Optical Soc. Amer. vol. A7, No. 3, Mar. 1990, p. 434.
R. Gonsalves, Proc. SPIE, vol. 351, Dec. 1982, p. 56.
J. Fienup et al., J. Optical Soc. Amer., vol. A7, No. 3, May 1990, p. 450.
J. Ohtsubo et al., Optical Eng., vol. 30, No. 9, Sep. 1991, p. 1332.

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