Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2002-10-16
2009-10-27
Lee, Hwa S (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07609388
ABSTRACT:
A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
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Arieli Yoel
Banitt David
Lanzmann Emmanuel
Levavi Shay
Saban Yoram
Darby & Darby P.C.
ICOS Vision Systems NV
Lee Hwa S
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