Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-11-22
2005-11-22
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S750010
Reexamination Certificate
active
06967491
ABSTRACT:
A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.
REFERENCES:
patent: 5270643 (1993-12-01), Richardson et al.
patent: 5430305 (1995-07-01), Cole, Jr. et al.
patent: 5451863 (1995-09-01), Freeman
patent: 5804980 (1998-09-01), Nikawa
patent: 6078183 (2000-06-01), Cole, Jr.
patent: 6137304 (2000-10-01), Nikawa
patent: 6483326 (2002-11-01), Bruce et al.
patent: 6546513 (2003-04-01), Wilcox et al.
patent: 6549022 (2003-04-01), Cole, Jr. et al.
Bruce et al., “Soft Defect Localization (SDL) on ICs”, Proceedings From the 28thInternational Symposium for Testing and Failure Analysis (ISTFA), pp. 21-27, Nov. 3-7, 2002.
Bruce et al., “Soft Defect Localization (SDL) on ICs”, Proceedings From the 28thInternational Symposium for Testing and Failure Analysis (ISTFA), pp. 21-27, Nov. 3-7, 2002.
Rowlette et al., Critical Timing Analysis in Microprocessors Using Near-IR Laser Assisted Device Alteration (LADA), ITC International Test Conference, pp. 264-273, 2003, no month.
Beaudoin Felix
Desplats Romain
Leibowitz Martin
Perdu Philippe
Vedagarbha Praveen
Credence Systems Corporation
Dorsey & Whitney LLP
Kobert Russell M.
Nguyen Vinh
LandOfFree
Spatial and temporal selective laser assisted fault... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Spatial and temporal selective laser assisted fault..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Spatial and temporal selective laser assisted fault... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3480750