Spatial and spectral wavefront analysis and measurement

Details Spatial and spectral wavefront analysis and measurement Spatial and spectral wavefront analysis and measurement

2007-11-30

2009-06-02

Lee, Hwa (Andrew) S (Department: 2886)

Optics: measuring and testing

By light interference

Reexamination Certificate

active

07542144

ABSTRACT:
A method and apparatus for wavefront analysis including obtaining a plurality of differently phase changed transformed wavefronts corresponding to a wavefront being analyzed which has an amplitude and a phase, obtaining a plurality of intensity maps of the plurality of phase changed transformed wavefronts and employing the plurality of intensity maps to obtain an output indicating the amplitude and phase of the wavefront being analyzed.

REFERENCES:
patent: 3694088 (1972-09-01), Gallagher et al.
patent: 4190366 (1980-02-01), Doyle
patent: 4407569 (1983-10-01), Piller et al.
patent: 4624569 (1986-11-01), Kwon
patent: 4653921 (1987-03-01), Kwon
patent: 4867565 (1989-09-01), Lequime
patent: 5159474 (1992-10-01), Franke et al.
patent: 5235587 (1993-08-01), Bearden et al.
patent: 5446540 (1995-08-01), Lin
patent: 5471303 (1995-11-01), Ai et al.
patent: 5600440 (1997-02-01), Bendall
patent: 5619372 (1997-04-01), Hellmuth et al.
patent: 5751475 (1998-05-01), Ishiwata et al.
patent: 5777736 (1998-07-01), Horton
patent: 5814815 (1998-09-01), Matsumoto et al.
patent: 5870191 (1999-02-01), Shirley et al.
patent: 5936253 (1999-08-01), Sugaya
patent: 5969853 (1999-10-01), Takaoka
patent: 5969855 (1999-10-01), Ishiwata et al.
patent: 6819435 (2004-11-01), Arieli et al.
patent: 2005/0007603 (2005-01-01), Arieli et al.
patent: 0 555 099 (1993-08-01), None
patent: 2 315 700 (1998-02-01), None
patent: 6186504 (1994-07-01), None
patent: 7225341 (1995-08-01), None
patent: 7261089 (1995-10-01), None
patent: 8094936 (1996-04-01), None
patent: 9179029 (1997-07-01), None
patent: 9230247 (1997-09-01), None
Phillion D.W. “General Methods for Generating Phase-Shifting Interferometry Algorithms”, Applied Optics, vol. 36, 8098 (1997).
Pluta M., “Stray-Light Problem in Phase Contrast Microscopy or Toward Highly Sensitive Phase Contrast Devices: A review”, Optical engineering, vol. 32, 3199 (1993).
Noda T. and Kawata S., “Separation of Phase and Absorption Images in Phase-Contrast Microscopy”, Journal of the Optical Society of America A, vol. 9, 924 (1992).
Creath K., “Phase Measurement Interferometry Techniques”, Progress in Optics XXVI, 348 (1988).
Greivenkamp J.E. “Generalized Data Reduction for heterodyne Interferometry”, Optical Engineering, vol. 23, 350 (1984).
Morgan C.J. “Least-Squares Estimation in Phase-Measurement Interferometry”, Optics Letters, vol. 7, 368 (1982).
Golden, L.J. “Zernike Test. 1: Analytical Aspects.”Applied Optics, vol. 16, (1977) 205.
Bruning, J.H., et al. “Digital Wavefront Measuring Interferometry for Testing Optical Surfaces and Lenses.”Applied Optics, vol. 13 (1974) 2693.
English Abstract of JP 9230247 dated Sep. 5, 1997.
English Abstract of JP 9179029 dated Jul. 11, 1997.
English Abstract of JP 8094936 dated Apr. 12, 1996.
English Abstract of JP 7261089 dated Oct. 13, 1995.
English Abstract of JP 7225341 dated Aug. 22, 1995.
English Abstract of JP 6186504 dated Jul. 8, 1994.

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