Spark sampling microparticle generator and method

Details Spark sampling microparticle generator and method Spark sampling microparticle generator and method

1993-10-15

1995-09-19

Evans, F. L.

Optics: measuring and testing

With sample preparation

356316, G01N 100, G01N 2162

Patent

active

054520690

ABSTRACT:
A spark sampling microparticle generator device and method providing means to first ionize a gap and then to switch a stabilized and controllable current into and out of said ionized gap to provide extremely high, selectable current density in a sample material in said gap with very fast rise and fall times to ablate said material to form microparticles. A plurality of identical modular circuits containing high frequency power transistors are selectably switchably connected in parallel simultaneously to the gap to achieve current densities which are higher than achievable with a single transistor, thereby obtaining the benefits of the high frequency response without being limited by the current limitations of the available transistors.

REFERENCES:
patent: 2758238 (1956-08-01), Todd
patent: 3188180 (1965-06-01), Holler
patent: 3791743 (1974-02-01), Cody et al.
patent: 3942892 (1976-03-01), Ambrose et al.
Sainz et al. Applied Spectroscopy, vol. 43, No. 3, 1989 pp. 553-558.

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