Span and null shift temperature compensated thin film strain...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system

Reexamination Certificate

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Reexamination Certificate

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06957584

ABSTRACT:
A temperature compensated strain gauge assembly comprises a strain gauge (10) having two or more resistor or piezoresistors (Rb) in half bridge or full bridge configuration and one or more temperatures compensating resistors or piezoresistors (Rc) connected in series with the bridge resistors or piezoresistors. The resistance of the temperature compensating resistor(s) or piezoresistor(s) is such that, as temperature changes, the compensating resistor(s) or piezoresistor(s) compensates for a change in span of the strain gauge so that, for a given load applied to the substrate, the span of the strain gauge will remain constant or substantially constant and compensate(s) the null shift of the strain gauge when the bridge resistors or piezoresistors are such as to provide a known offset at a given temperature.

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patent: 5805028 (1998-09-01), Kato

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