Space compression technique for pseudo-exhaustive self-testing o

Details Space compression technique for pseudo-exhaustive self-testing o Space compression technique for pseudo-exhaustive self-testing o

1991-06-03

1994-05-03

Teska, Kevin J.

Excavating

371 221, H04B 1700

Patent

active

053094476

ABSTRACT:
Compaction of the response signals produced by separate sets of sub-circuits (12.sub.i) within a digital circuit (10) under test is accomplished by first analyzing each response signal produced by a corresponding set of sub-circuits (by way of a logic analyzer (16,18)) to determine if the response signal has a particular pattern. A pattern bit is then set in accordance with the response signal which has the particular pattern. The pattern bits are then compacted by a set of daisy-chained time compactors (20), each compactor serving to exclusively OR the pattern bit from a corresponding logic analyzer (16,18) with a compacted bit generated previously by an upstream compactor.

REFERENCES:
patent: 4513418 (1985-04-01), Bardell, Jr. et al.
patent: 4811344 (1989-03-01), Chauvel et al.
patent: 4817093 (1989-03-01), Jacobs et al.
patent: 4864570 (1989-09-01), Savaglio et al.
patent: 4945536 (1990-07-01), Hancu
patent: 4996689 (1991-02-01), Samad
patent: 5038349 (1991-08-01), Lipp
patent: 5184067 (1993-02-01), Nozuyama
patent: 5187712 (1993-02-01), Malleo-Roach et al.
patent: 5189675 (1993-02-01), Nozuyama et al.
patent: 5230000 (1993-07-01), Mozingo et al.
E. J. McCluskey and S. Bozorgui-Nesbat, "Design for Autonomous Test," IEEE Transactions on Computers, vol. C-30, No. 11, Nov. 1981, pp. 866-867.
S. B. Akers, "On the Use of Linear Sums in Exhaustive Testing," Proceedings, Fault Tolerant Computing Conference, pp. 148-153 (IEEE).
E. Wu, "Towards an Optimal Pseudo-Exhaustive Test Generation Algorithm," Conference Proceedings, Built-In Self-Test Workshop, IEEE Test Technology Committee, Mar. 23-25, 1988.

Affiliated with

Also associated with

Rating

Space compression technique for pseudo-exhaustive self-testing o does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Space compression technique for pseudo-exhaustive self-testing o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Space compression technique for pseudo-exhaustive self-testing o will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2121225