Source of charged particles beam

Electric lamp and discharge devices: systems – Discharge device load with fluent material supply to the... – Electron or ion source

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Details

250423F, 313336, 315341, 31511101, H01J 724

Patent

active

044383711

ABSTRACT:
A source of charged particles beam which can be used either as an electron source or an ion source and has a tip formed of carbide, nitride or di-boride of at least one of elements Ti, Zr, Hf, V, Nb and Ta or formed of hexa-boride of at least one of rare earth metal elements of atomic number 57 to 70.

REFERENCES:
patent: 3315125 (1967-04-01), Frolich
patent: 3405263 (1968-10-01), Wanlass et al.
patent: 4193013 (1980-03-01), Futamoto et al.

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