Source-measure unit based on digital control loop

Coded data generation or conversion – Analog to or from digital conversion – Converter is part of control loop

Reexamination Certificate

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Details

C702S060000

Reexamination Certificate

active

07903008

ABSTRACT:
A source-measure unit (SMU) may be implemented with a control loop configured in the digital domain. The output voltage and output current may be measured with dedicated ADCs (analog-to-digital converters). The readings obtained by the ADCs may be compared to a setpoint, which may be set in an FPGA (field programmable gate array) or DSP (digital signal processing) chip. The FPGA or DSP chip may then be used to produce an output to drive a DAC (digital-to-analog converter) until the output voltage and/or output current reach the respective desired levels. The readback values may be obtained by averaging the voltage and/or current readings provided by the ADCs. The averaging may be weighted to improve noise rejection. The digital control loop provides added flexibility to the SMU and a decrease in the accuracy requirements on the DAC, while also for solving potential range-switching issues that may arise within the SMU.

REFERENCES:
patent: 5579236 (1996-11-01), Tamamura et al.
patent: 5754041 (1998-05-01), Kaito et al.
patent: 5970074 (1999-10-01), Ehiro
patent: 7502697 (2009-03-01), Holmquist et al.
patent: 2009/0015221 (2009-01-01), Kodera

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