Source level control for impedance meter

Details Source level control for impedance meter Source level control for impedance meter

1990-10-25

1991-05-28

Wieder, Kenneth

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324607, 324608, 324676, 324710, G01R 2728

Patent

active

050197819

ABSTRACT:
An impedance meter with improved measurement accuracy obtained by controlling the level of the signal source. The impedance meter comprises a signal source, feedback amplifier, synchronous detector, A/D and control logic. The source level is maintaind by the control logic at a predetermined value by measuring the output of a synchronous detector and intermittently adjusting the level of the source thereby compensating for variations in test object's impedance. Control logic algorithms employed include successive substitution, bisection and linear interpolation.

REFERENCES:
patent: 3325727 (1967-06-01), Haas
patent: 4080562 (1978-03-01), Rubel et al.
patent: 4409543 (1983-10-01), Sugihara
patent: 4458196 (1984-07-01), Goyal et al.
patent: 4481464 (1984-11-01), Noguchi et al.
patent: 4728881 (1988-03-01), Evans et al.
Kameoka, "Measuring High-Value Capacitors", H.P. Journal, Mar. 1972, pp. 8-13.

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