Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2006-08-02
2008-08-12
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C438S652000, C438S653000
Reexamination Certificate
active
07411298
ABSTRACT:
A source/drain electrode is used in a thin-film transistor substrate containing a substrate, a thin-film transistor semiconductor layer, source/drain electrodes, and a transparent picture electrode. The source/drain electrode includes a nitrogen-containing layer and a thin film of pure aluminum or an aluminum alloy. Nitrogen of the nitrogen-containing layer binds to silicon of the thin-film transistor semiconductor layer, and the thin film of pure aluminum or aluminum alloy is connected to the thin-film transistor semiconductor layer through the nitrogen-containing layer.
REFERENCES:
patent: 5514909 (1996-05-01), Yamamoto et al.
patent: 6033542 (2000-03-01), Yamamoto et al.
patent: 6064091 (2000-05-01), Deane et al.
patent: 6096438 (2000-08-01), Takagi et al.
patent: 6218206 (2001-04-01), Inoue et al.
patent: 6252247 (2001-06-01), Sakata et al.
patent: 6534349 (2003-03-01), Kubota et al.
patent: 2003/0047812 (2003-03-01), Hagihara et al.
patent: 2004/0126608 (2004-07-01), Gotoh et al.
patent: 2005/0184395 (2005-08-01), Gotoh et al.
patent: 2005/0224795 (2005-10-01), Gotoh et al.
patent: 2006/0007366 (2006-01-01), Gotoh et al.
patent: 2006/0091792 (2006-05-01), Kugimiya
patent: 2007/0040172 (2007-02-01), Kawakami et al.
patent: 8-330600 (1996-12-01), None
patent: 11-283934 (1999-10-01), None
patent: 11-284195 (1999-10-01), None
patent: 11-337976 (1999-12-01), None
patent: 2003-273109 (2003-09-01), None
patent: 2004-104101 (2004-04-01), None
U.S. Appl. No. 11/743,916, filed May 3, 2007, Kawakami et al.
U.S. Appl. No. 11/431,580, filed May 11, 2006, Toshihiro Kugimiya et al.
U.S. Appl. No. 11/471,595, filed Jun. 21, 2006, Hiroshi Gotoh et al.
U.S. Appl. No. 11/349,520, filed Feb. 8, 2006, Hiroshi Gotoh et al.
U.S. Appl. No. 11/341,531, filed Jan. 30, 2006, Toshihiro Kugimiya et al.
U.S. Appl. No. 11/461,927, filed Aug. 2, 2006, Kugimiya et al.
Gotoh Hiroshi
Hino Aya
Kawakami Nobuyuki
Kugimiya Toshihiro
Tomihisa Katsufumi
Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel Ltd).
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Patton Paul E
Smith Zandra
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