Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2006-09-12
2006-09-12
Patel, Ramesh (Department: 2121)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S095000, C700S108000, C700S109000, C700S213000, C700S215000, C250S306000, C250S307000, C250S234000
Reexamination Certificate
active
07107117
ABSTRACT:
A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing includes storing fabrication deviation data, probe data, and test data in association with the fuse ID of each of the devices indicating each of the devices requires either enhanced reliability testing or standard testing. The fuse ID of each of the devices is then automatically read before, during, or after standard testing of the devices. The testing process requirement data stored in association with the fuse ID of each of the devices is then accessed, and the devices are sorted in accordance with the accessed data into those devices requiring enhanced reliability testing and those requiring standard testing.
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Abstract from JP 5-74909, in English, comprising a concise explanation of the relevance of JP-74909 as required by 37 CFR § 1.98(a)(3).
Fresonke, Dean,In-Fab Identification Silicon Wafers with Clean, Laser Marked Barcodes, Advanced Semiconductor Manufacturing Conference and Workshop, 1994, IEEE/SEMI, pp. 157-160.
Micro)n Technology, Inc.
Patel Ramesh
TraskBritt
LandOfFree
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