Sorted data outlier identification

Details Sorted data outlier identification Sorted data outlier identification

2008-11-20

2011-10-18

Levin, Naum (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Logic design processing

C714S724000, C703S002000

Reexamination Certificate

active

08042073

ABSTRACT:
Embodiments of the present invention provide for sorted data signature analysis for identifying outliers in datasets. Some embodiments disclose a nearest pattern smallest delta procedure to identify outliers in a dataset of vector patterns. Other embodiments disclose a nearest neighbor smallest delta procedure to identify outliers among values from dies in a wafer. Still other embodiments may be disclosed and claimed.

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