Measuring and testing – Instrument proving or calibrating – Fluid pressure
Patent
1997-06-03
1998-09-15
Raevis, Robert
Measuring and testing
Instrument proving or calibrating
Fluid pressure
G01L 2700
Patent
active
058081755
ABSTRACT:
An in-process method and apparatus for monitoring and correcting or replacing a low pressure sensor that gives incorrect low pressure readings because of being contaminated or defective during the formation of integrated circuit structures in a low pressure chemical vapor deposition chamber, where deposition rates are a function of gas flow, temperature, and chamber pressure.
REFERENCES:
patent: 4051712 (1977-10-01), Zias et al.
patent: 4658829 (1987-04-01), Wallace
patent: 5348614 (1994-09-01), Jerbic
patent: 5443997 (1995-08-01), Tsui et al.
Ackerman Stephen B.
Raevis Robert
Saile George O.
Vanguard International Semiconductor Corporation
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