Solid state temperature measurement

Details Solid state temperature measurement Solid state temperature measurement

1998-03-25

1999-12-28

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

External effect

Temperature

327 83, H01L 3500

Patent

active

060086858

ABSTRACT:
In a temperature measuring circuit suitable for implementation on an integrated circuit (IC) a plurality, M, nominally unit value current sources are individually and collectively applied to a sensor such as a diode or transistor. The resulting individual V.sub.BE voltages are measured and used to form an average, V.sub.BE(AVG), of the individual voltages. The difference .DELTA.V.sub.BE between the voltage, V.sub.BE(TOT), resulting from application of all M current sources and V.sub.BE(AVG) is used to solve for temperature in a relationship that is independent of the current values used. An error-corrected version of a sigma-delta analog-to-digital converter (ADC) is used to convert the analog measurements into digital signals representative of temperature.

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