1983-10-07
1986-04-29
Sikes, William L.
H01L 2714, H01L 3100
Patent
active
045860688
ABSTRACT:
A solid state photon detector includes a semiconducting blocking layer with sufficiently low donor and acceptor concentrations that substantially no charge transport can occur by an impurity conduction mechanism. A semiconducting buffered layer is provided with a sufficiently high donor impurity concentration to create an impurity energy band and with a sufficiently high acceptor impurity concentration that an electron cannot be injected into and drift through the layer without recombining with ionized donors. A semiconducting active layer is positioned between the blocking and buffered layers with a sufficiently high donor concentration to create an impurity energy band. The acitve layer also includes a sufficiently low acceptor impurity concentration that a photogenerated electron can drift through the active layer without recombining with ionized donors. A first electrical contact with the blocking layer collects electrons without injecting D+ charge carriers, while a second electrical contact with the buffered layer collects carriers from the impurity band. The detector is designed to operate with a sufficient electrical bias applied between the first and second contacts to raise the field at some point in the active layer to the threshold for impact ionization of donor impurities. Under appropriate conditions, such detectors are capable of detecting single photons.
REFERENCES:
patent: 4301592 (1981-11-01), Lin
Bratt, Impurity Germanium and Silicon Infrared Detectors, in Semiconductors and Semimetals, vol. 12, p. 85, (R. Willardson ed. 1977).
Efros, et al., Impurity Conductivity in Low Compensated Semiconductors, Phys. Stat. Sol. (b), vol. 50, p. 45 (1972).
Kasuya, A Theory of Impurity Conduction I, J. Phys. Soc. Japan, vol. 13, p. 1096 (1958); Kasuya, et al., A Theory of Impurity Conduction II, J. Phys. Soc. Japan, vol. 13, p. 1287 (1958).
Miller, et al., Impurity Conduction at Low Concentrations, Phys. Rev., vol. 120, p. 745 (1960).
Mott, The Metal-Insulator Transition in Extrinsic Semiconductors, Adv. Phys., vol. 21, p. 785 (1972).
Mott, et al., The Model and General Discussion of Impurity Conduction, in Theory of Impurity Conduction, Adv. Phys., vol. 10, p. 110 (1961).
Richards, et al., Infrared Detectors for Low-Background Astronomy: Incoherent and Coherent Devices for One Micrometer to One Millimeter, in Infrared and Millimeter Waves, vol. 6, p. 149 (K. Button ed. 1982).
Rose, An Analysis of Photoconductive Photon Counting, Proc. 3rd Photoconductivity Conf., p. 7 (E. Pell ed. 1969).
Stillman, et al., Avalanche Photodiodes, in Semiconductors and Semimetals, vol. 12, p. 291 (Willardson and Beers eds. 1977).
Van Lien, et al., Activation Energy of Hopping Conduction in Heavily Doped Semiconductors, Sov. Phys. Semicond., vol. 13, p. 1281 (1979).
Kleinhans William A.
Petroff Michael D.
Stapelbroek Maryn G.
Deinken John J.
Hamann H. Fredrick
Malin Craig O.
Rockwell International Corporation
Sikes William L.
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