Measuring and testing – Volume or rate of flow – Thermal type
Patent
1998-07-01
2000-03-07
Oen, William
Measuring and testing
Volume or rate of flow
Thermal type
7320425, G01F 168
Patent
active
060325275
ABSTRACT:
A solid state microanemometer is micromachined from a bonded silicon wafer comprising two silicon layers. The microanemometer comprises a first semiconductor wafer doped with an impurity having an upper planar surface and a lower planar surface with a peripheral edge; and a second semiconductor wafer bonded to the first semiconductor wafer having an upper planar surface; a lower surface; and a cavity having a peripheral edge and a peripheral margin defined on the upper planar surface and bounded by the peripheral edge of the cavity wherein the lower planar surface of the first semiconductor is bonded to the peripheral margin of the cavity so as to at least partially close the cavity wherein 0.025 to 99% of the peripheral edge of the lower planar surface of the first semiconductor overlaps with the peripheral edge of the cavity.
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Genova Perry A.
Tsuei Timothy W.
Memsys, Inc.
Oen William
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