Solid-state imaging device with gate contacts overlapping...

Details Solid-state imaging device with gate contacts overlapping... Solid-state imaging device with gate contacts overlapping...

2005-10-18

2008-11-25

Villecco, John M (Department: 2622)

Television

Camera, system and detail

Solid-state image sensor

C250S208100, C257S291000

Reexamination Certificate

active

07456889

ABSTRACT:
A solid-state imaging device has an imaging region in which unit cells, each of which includes a photoelectric conversion section and a signal scanning circuit section, are disposed on a semiconductor substrate in a two-dimensional manner. The signal scanning circuit section is composed of a plurality of transistors. At least part of a gate contact of each transistor in the signal scanning circuit section is formed on an active region of each transistor.

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