Solid-state imaging device production method and solid-state...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal

Reexamination Certificate

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C438S038000, C257S431000

Reexamination Certificate

active

06991951

ABSTRACT:
A solid-state imaging device production method is provided. A light-receiving section12is formed on a semiconductor substrate1. A first insulating film6is formed on a light-receiving section12and the semiconductor substrate1. A metal film for wiring is formed on the first insulating film6. A protection film8is formed on the metal film. A resist film is formed on a predetermined region of the protection film. A portion of the protection film8and a portion of the metal film is removed by using the resist film to form a wire7whose upper face is covered by the protection film8. A hydrogen-containing second insulating film10is formed on the wire7and the first insulating film6. A heating process is performed for the second insulating film10. An anisotropic etching process is performed for the entire surface of the second insulating film10to remove the second insulating film10.

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patent: 6403994 (2002-06-01), Wada
patent: 6635529 (2003-10-01), Inomata
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patent: 5-283667 (1993-10-01), None
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patent: 2002-016134 (2002-01-01), None

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