Solid-state imaging device comprising an N-type layer...

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation

Reexamination Certificate

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C438S419000, C257S292000, C257SE27162

Reexamination Certificate

active

07915069

ABSTRACT:
An n/p semiconductor substrate is formed in such a manner that an n type semiconductor layer is deposited on a p+semiconductor substrate. An imaging area including a plurality of n type semiconductor regions making photoelectric conversion and a plurality of p type semiconductor region for isolation formed around the n type semiconductor regions, is formed in the n/p semiconductor substrate. The n type semiconductor layer is divided into an upper layer and a lower layer. A second n type semiconductor region is formed to connect to the p+type semiconductor substrate from a surface of the n/p semiconductor substrate in a peripheral region of the imaging area.

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patent: 6403994 (2002-06-01), Wada
patent: 7205584 (2007-04-01), Rhodes et al.
patent: 2006/0219867 (2006-10-01), Yamaguchi et al.
patent: 2008/0251822 (2008-10-01), Yamaguchi et al.
patent: 2008/0265295 (2008-10-01), Brady
patent: 2001-160620 (2001-06-01), None
patent: 2001-223351 (2001-08-01), None

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