Solid-state imaging device and interline transfer CCD image...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

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Details

C257S221000, C257S225000, C257S239000, C257S240000, C257S241000, C257S246000, C257SE27082, C257SE27083, C257SE27150, C257SE29227

Reexamination Certificate

active

10742419

ABSTRACT:
A high-performance solid-state imaging device is provided. The solid-state imaging device includes: a plurality of pixel cells; and a driving unit. Each of the plurality of pixel cells includes: a photodiode that converts incident light into a signal charge and stores the signal charge; a MOS transistor that is provided for reading out the signal charge stored in the photodiode; an element isolation portion that is formed of a STI that is a grooved portion of the semiconductor substrate so that the photodiode and the MOS transistor are isolated from each other; and a deep-portion isolation implantation layer that is formed under the element isolation portion for preventing a flow of a charge from the photodiode to the MOS transistor.

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patent: 2003-0001797 (2003-01-01), None

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