Solid state imaging device

Optical: systems and elements – Single channel simultaneously to or from plural channels – By surface composed of lenticular elements

Reexamination Certificate

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Details

C359S619000, C359S622000, C257S232000, C257S294000, C257S432000, C250S208100

Reexamination Certificate

active

06970293

ABSTRACT:
In a solid state imaging device, sensitivity deterioration (shading) of the periphery of the imaging region is planned to be improved. An on-chip micro lens28corresponding to each sensor portion23in an imaging region42is comprised and the center of the reduction magnification of the exit pupil correction which is performed for the on-chip micro lens28is set to a positionOdeviated from the center of the imaging region42.

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patent: 1-213079 (1989-08-01), None

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