Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Reexamination Certificate
2011-03-08
2011-03-08
Sefer, A. (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Electromagnetic or particle radiation
C257S290000, C257S294000, C257S435000, C257S447000, C257S462000, C257SE27133, C257SE31073, C257SE31077, C348S294000
Reexamination Certificate
active
07902622
ABSTRACT:
A solid-state imaging device includes a photoelectric conversion section which is provided for each pixel and which converts light incident on a first surface of a substrate into signal charges, a circuit region which reads signal charges accumulated by the photoelectric conversion section, a multilayer film including an insulating film and a wiring film, the multilayer film being disposed on a second surface of the substrate opposite to the first surface, and a transmission-preventing film disposed at least between the wiring film in the multilayer film and the substrate.
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Japanese Office Action issued Nov. 9, 2010 for corresponding Japanese Application No. 2004-306182.
Furukawa Masakazu
Mabuchi Keiji
Rader & Fishman & Grauer, PLLC
Rodela Eduardo A
Sefer A.
Sony Corporation
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