Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With reflector – opaque mask – or optical element integral...
Reexamination Certificate
2006-11-01
2010-11-09
Louie, Wai-Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Incoherent light emitter structure
With reflector, opaque mask, or optical element integral...
C257S432000
Reexamination Certificate
active
07829908
ABSTRACT:
Solid-state image sensors are disclosed that include an optical unit which separates incident light into a plurality of color elements, an optical receiving unit which converts each of the color elements separated by the optical unit to an electrical signal and an anti-reflection film having a high-refractive-index layer with a refractive index of 1.7 or higher and a low-refractive-index layer with a refractive index of less than 1.7. The anti-reflection film is between the optical unit for each of color elements and the optical receiving unit, on a semiconductor substrate. Each of the high-refractive-index layer and the low-refractive-index layer corresponds to at least one color element of the plurality of color elements and includes two or more layers. With such sensors it is possible to suppress the variation in sensitivity for each color.
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English-language translation of International Preliminary Report on Patentability issued in corresponding international application No. PCT/JP2006/321881.
Jahan Bilkis
Klarquist & Sparkman, LLP
Louie Wai-Sing
Nikon Corporation
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