Solid-state image sensor having a voltage applier and signal...

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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Details

C340S307000

Reexamination Certificate

active

07923674

ABSTRACT:
After resetting the potential VPD of the photodiode (11) to the predetermined potential VRST, light is incident onto the photodiode (11) for a predetermined period to decrease the VPD corresponding to the amount of the incident light. After that, a declivous ramp voltage VRAMP is applied to the source terminal of the first MOS transistor (12) which is a common-source amplifier for reading out the VPD. When the voltage difference between the gate and source of the MOS transistor (12) exceeds a threshold voltage, the MOS transistor is turned on and the output suddenly decreases. If a signal having a pulse width from the starting point of the sweep of the ramp voltage to the sudden lowering point of the output is generated, the pulse width depends on the amount of the incident light. With the signal readout of this PWM method, it is possible to lower the power consumption while a wide dynamic range is maintained, and to downsize the picture cells to achieve a higher number of picture cells.

REFERENCES:
patent: 6642494 (2003-11-01), Endo
patent: 6642495 (2003-11-01), Lowrance et al.
patent: 6697113 (2004-02-01), Tanaka et al.
patent: 6803952 (2004-10-01), Watanabe
patent: 2001/0020909 (2001-09-01), Sakuragi et al.
patent: A 10-269345 (1998-10-01), None
patent: A 2001-346102 (2001-12-01), None
patent: A 2001-346106 (2001-12-01), None
patent: A 2005-198149 (2005-07-01), None
Shouho et al., “A Low-Voltage Pulse-Width-Modulation Image Sensor”, CCD & AIS, Jun. 9, 2005.

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