Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device
Reexamination Certificate
2008-05-27
2008-05-27
Quach, Tuan N. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Charge transfer device
C257S233000, C257SE27139
Reexamination Certificate
active
07378691
ABSTRACT:
A solid-state image sensor capable of suppressing blooming and increase of a dark current also when an n-type impurity concentration in a transfer channel region is increased is obtained. In this solid-state image sensor, gate electrodes of a prescribed pixel and another pixel adjacent to the prescribed pixel are provided at a first space, and a larger quantity of second conductivity type impurity is introduced into a region of a first conductivity type transfer channel region, located on the main surface of a substrate, corresponding to the first space as compared with a second conductivity type impurity contained in the remaining region of the transfer channel region other than the region corresponding to the first space.
REFERENCES:
patent: 6331873 (2001-12-01), Burke et al.
patent: 7214974 (2007-05-01), Shin
patent: 7271430 (2007-09-01), Park et al.
patent: 2005/0230720 (2005-10-01), Miyagawa et al.
patent: 2006/0049431 (2006-03-01), Kaida
patent: 2001-53263 (2001-02-01), None
Arimoto Mamoru
Geshi Tatsurou
McDermott Will & Emery LLP
Quach Tuan N.
Sanyo Electric Co,. Ltd.
LandOfFree
Solid-state image sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Solid-state image sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Solid-state image sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2803783