Solid-state image pickup element and solid-state image...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

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Details

C257S232000, C257S233000, C257S240000, C257S243000, C257S248000, C257SE21158, C257SE27150

Reexamination Certificate

active

07956388

ABSTRACT:
It is intended to provide a solid-state image pickup element capable of reducing an area of a read channel to increase a light-receiving area. The solid-state image pickup element comprises a p-type planar semiconductor, a hole formed in the p-type planar semiconductor, a p+-type region formed in a bottom of the hole, a p+-type isolation region formed in a part of a sidewall of the hole and connected to the p+-type region, an n-type photoelectric conversion region formed beneath the p+-type region, a transfer electrode formed on the entire sidewall of the hole through a gate dielectric film, a CCD channel region formed in a top of the p-type planar semiconductor, and a read channel formed in a region of the p-type planar semiconductor between the n-type photoelectric conversion region and the CCD channel region.

REFERENCES:
patent: 5029321 (1991-07-01), Kimura
patent: 6087685 (2000-07-01), Harada
patent: 7364960 (2008-04-01), Lyu
patent: 2009/0283804 (2009-11-01), Masuoka et al.
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patent: 2001-308309 (2001-11-01), None
International Search Report for International Application No. PCT/JP2008/069321, dated Nov. 25, 2008, 7 pages.
Written Opinion of the International Searching Authority for International Application No. PCT/JP2008/069321, dated Nov. 25, 2008, 9 pages.

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