Solid state image pickup device, method for producing the...

Optical: systems and elements – Single channel simultaneously to or from plural channels – By surface composed of lenticular elements

Reexamination Certificate

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Reexamination Certificate

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10991396

ABSTRACT:
The present invention inhibits variations in sensitivity of an image pickup element formed in a jointed area in the image pickup element produced using exposure in a joined fashion.The image pickup element11has a light receiving area102formed on a substrate101, an insulation layer104deposited on a light receiving area102, and a microlens106formed on the insulation layer104and collecting incident light onto the light receiving area102. A pattern103L and a pattern103R with an optical axis of the microlens106as a divisional line by exposure in a joined fashion in different exposure steps are arranged with an optical path for incident light collected by the microlens106held therebetween, and are provided so that a clearance from the optical path equals a distance L. The distance L is set to be larger than the alignment accuracy of an exposure device exposing the patterns103L and103R.

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