Solid state image pickup device including an integrator with...

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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Details

C250S208100, C348S297000, C348S310000

Reexamination Certificate

active

07087881

ABSTRACT:
In order to provide a solid state image pickup device in which an offset voltage in an image signal from which a noise signal is removed is made to be low, when an image pickup operation is performed while the MOS transistor T1is ON, after a signal φVD with a value Vh is integrated by a capacitor C, the signal φVD is Vm (Vm<Vh) and a pulse signal φV is given so that an image signal is output. When dispersion of sensitivity is detected while the MOS transistor T1is OFF, after the signal φVD with the value Vh is integrated by the capacitor C, the signal φVD is V1(V1<Vm) and the pulse signal φV is given so that a noise signal is output.

REFERENCES:
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patent: 5289286 (1994-02-01), Nakamura et al.
patent: 5861621 (1999-01-01), Takebe et al.
patent: 6201617 (2001-03-01), Kusaka
patent: 6836291 (2004-12-01), Nakamura et al.
patent: 2001/0013571 (2001-08-01), Kakumoto et al.
patent: 2003/0197799 (2003-10-01), Dyas et al.
patent: 11-313257 (1999-11-01), None
patent: 2001-094878 (2001-04-01), None
patent: 2001-223948 (2001-08-01), None

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