Solid state image pickup device

Details Solid state image pickup device Solid state image pickup device

2007-01-16

2007-01-16

Ometz, David (Department: 2622)

Television

Camera, system and detail

Optics

C348S294000, C348S315000, C348S364000, C396S100000, C257S291000, C257S463000

Reexamination Certificate

active

10361598

ABSTRACT:
A solid state image pickup device is provided which can reduce crosstalks between range finding photoelectric conversion elements (AF sensor) and photometry photoelectric conversion elements (AE sensor). The solid state image pickup device has an n-type epitaxial semiconductor region, a p-type first well region formed in the semiconductor region, a p-type second well region formed in the semiconductor region and electrically separated from the first well, an n-type first impurity doped region formed in the first well region and an n-type second impurity doped region formed in the second well, wherein a photometry photoelectric conversion element is formed by using the p-type first well region and n-type first impurity doped region, and a range finding photoelectric element is formed by using the p-type second well region and n-type impurity doped region.

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