Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-10-17
2008-11-04
Nguyen, Vincent Q. (Department: 2831)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S415000, C324S649000, C361S154000, C361S173000
Reexamination Certificate
active
07446541
ABSTRACT:
A solenoid test device includes a clock circuit, a control circuit, and an output port configured for coupling to two ends of a solenoid. The clock circuit generates a clock signal and sends it to the control circuit. The control circuit periodically and alternately couples one of the two ends of the solenoid to ground via the output port under the control of the clock signal. The solenoid test device is used to generate a periodic control signal to test service life and stability of solenoids.
REFERENCES:
patent: 4242631 (1980-12-01), Hall
patent: 4599675 (1986-07-01), Fisher et al.
patent: 4746869 (1988-05-01), Schrag et al.
patent: 4932246 (1990-06-01), Deutsch et al.
patent: 5784245 (1998-07-01), Moraghan et al.
patent: 6147498 (2000-11-01), Sumiya et al.
patent: 2007/0279047 (2007-12-01), Schumacher
NA555, NE555, SA555, SE555 Precision Timers Data Sheet, SLF022F, Sep. 1973, Revised Jun. 2006, p. 10, Copyright 1973-2006, Texas Instruments, Incorporated.
Gan Xiao-Lin
Ho Yu-Kuang
Xiao Ren-Jun
Baldridge Benjamin M
Chung Wei Te
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry ( ShenZhen) Co., Ltd.
Nguyen Vincent Q.
LandOfFree
Solenoid test device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Solenoid test device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Solenoid test device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4045234