Metal fusion bonding – Process – With measuring – testing – indicating – inspecting – or...
Patent
1994-11-21
1996-07-09
Bradley, P. Austin
Metal fusion bonding
Process
With measuring, testing, indicating, inspecting, or...
228 565, H05K 334, B23K 306
Patent
active
055336639
ABSTRACT:
In a wave solder manufacturing process, a test device is used to measure the contact-area between a solder wave and a printed wiring board. In particular, the test device is a printed wiring board (PWB) that includes at least two arrays of electrical contacts, one array near each side of the PWB. As the PWB makes contact with a solder wave, the number of electrical contacts in each array that are grounded by the solder wave are counted and displayed on an alpha-numeric display mounted on top of the PWB. This "distance-based" measurement provides an accurate determination of the uniformity of the contact-area, and concomitantly the dwell-time of the soldering process.
REFERENCES:
patent: 4180199 (1978-02-01), O'Rourke
patent: 4632291 (1986-12-01), Rahn et al.
patent: 5023848 (1989-05-01), Frey et al.
patent: 5388468 (1995-02-01), Sasson
Massini, Jr. Anthony L.
Shepard Roy D.
AT&T Corp.
Bradley P. Austin
Knapp Jeffrey T.
Opalach Joseph J.
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