Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-06-12
1999-12-21
Karlsen, Ernest
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324717, G01R 2708
Patent
active
060053992
ABSTRACT:
This invention relates to an on-line statistical process control device for solder paste and residues. The invention consists of electronics hardwa software, and probing systems. The electrical hardware of the invention provides voltage and current measurements of solder paste materials, the software of the invention controls the hardware, provides real-time complex, non-linear least squares curve fitting for equivalent circuit analysis, data storage and retrieval of circuit parameters and behavior, and to statistical process control tracking and charting. The probing systems of the invention allows for 2, 3, and 4 probe surface and bulk measurements of the solder paste and residues.
REFERENCES:
patent: 5369370 (1994-11-01), Stratmann et al.
patent: 5448178 (1995-09-01), Chen et al.
patent: 5485392 (1996-01-01), Frederickson et al.
patent: 5674375 (1997-10-01), Thompson
Amin Mohammad N.
Cragoe Alex E.
DeLieto Anthony L.
Frederickson Michael D.
Hirthe Richard W.
Billi Ron
Karlsen Ernest
The United States of America as represented by the Secretary of
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