Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2006-08-09
2010-02-09
Bahta, Kidest (Department: 2123)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S306000, C702S183000
Reexamination Certificate
active
07660643
ABSTRACT:
A solder material test apparatus includes a control unit and a storage unit which stores master data in advance in which a printing process time when a printing process is performed by using a test-sample solder material is associated with deterioration degree data of the test-sample solder material at the printing process time. The control unit includes a deterioration degree data acquiring unit which acquires deterioration degree data for indicating a deterioration degree of a test-sample solder material, a reading unit which reads a printing process time associated with deterioration degree data set as a limit value with reference to master data and reads a printing process time associated with the deterioration degree data acquired by the deterioration degree data acquiring unit, an operating unit which operates an available remaining time that indicates difference between the printing process times, and a display control unit which informs the available remaining time to a user.
REFERENCES:
patent: 5476207 (1995-12-01), Peterson et al.
patent: 2003/0230718 (2003-12-01), Shelley et al.
patent: 2004/0182573 (2004-09-01), Gunawardana et al.
Horino Masanobu
Ohashi Katsumi
Onishi Yasuhiro
Bahta Kidest
Foley & Lardner LLP
Laughlin Nathan
Omron Corporation
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